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The Secondary Ion/Accelerator Mass Spectrometer

The UCLA MegaSIMS consists of a secondary ion mass spectrometer (SIMS) front end coupled to an accelerator mass spectrometer (AMS) through a band-pass mass filter (the recombinator). This instrument has been designed specifically to tackle the unique analytical challenges posed by the Genesis samples: dilute elemental concentrations, limited sample material, and close proximity of likely surface contamination to the implanted solar wind ions. The design criteria and overall instrument description were described here (McKeegan et al., LPSC 2000, 2004). In this page, we describe our progress on the integration of the instrument, as well as some pictures of the now-completed MegaSIMS. Likewise, to the right are links to details about the MegaSIMS' instrumentation, performance, the photolog, and some of the key results obtained thus far.

Celebration of first ion image

The PI inspects
bottomleftshadow Last Modified: December 5, 2008, 1:06 pm | megasims [at] bottomrightshadow